International Test Conference Exhibition

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International Test Conference Exhibition

Date:	Oct 24 - 26, 2006 8:00am - 4:00pm
Location:	Santa Clara Convention Center
City:	Santa Clara, CA

International Test Conference is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

During ITC Test Week, VI Technology will have technical experts to discuss your applications and demonstrate our award winning Arendar Enterprise Test Data Management software.

For more information, please visit:
http://www.itctestweek.org

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