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Solutions Enterprise Test Solutions Arendar Arendar 2009 Suite Multimedia Test System Industry Solutions Semiconductor Communications Aerospace / Defense Biomedical / Biotech Automotive Process Manufacturing Energy Semiconductor Literature & Demo Software Brochures Brochures Descriptions of VI Technology products and services. Automated Test Solutions This 4-page brochure provides an overview of VI Technology's products and services for automated test systems, measurement, real-time control and enterprise test data management. The brochure also includes customer quotations and application examples that describe how VI Technology helps companies reduce their product development costs and time to market. Arendar Enterprise Test Software This 6-page brochure gives an overview of the capabilities of Arendar Enterprise Test Software. The brochure includes how Arendar manages test data, the technologies in Arendar, desktop and enterprise configurations, scalability, automatic code generation, and descriptions of the suite of Arendar software applications. Customer Application Solutions Customer Application Solutions In-depth technical papers that explain the techniques to develop test systems as well as measurement and automation systems.   Enterprise TDM Solution Increases IC Characterization Efficiency This solution describes how a large semiconductor manufacturer and also a leading OEM supplier of hard disk drive preamplifier and motor controller solution was able to leverage an enterprise test data management solution developed by VI Technology to increase the efficiency of their integrated circuit testing and characterization process. VI Technology Implements Advanced Printing Test System for PARC® PARC (Palo Alto Research Center, Inc., a Xerox subsidiary), a research and development pioneer in the field of advanced laser printing technologies, needed a solution for testing and analyzing the performance of a next-generation industrial printing system. This solution describes how the test system implemented by VI Technology provides PARC with the flexibility to use the print head test system both as a research and development tool and also as a platform for demonstrating their advanced industrial printing system capabilities to prospective customers. PVD Semiconductor Process Chamber Functional Testing This solution describes a PC-based system that performs automated functional testing for a family of Physical Vapor Deposition (PVD) semiconductor process chambers. The functional test system operates in a clean room facility and uses PC-based data acquisition cards and various DeviceNet I/O modules to perform the tests. Next-Generation Gas Delivery System for Semiconductor Manufacturers This solution describes an automated gas delivery system VI Technology developed using LabVIEW, data acquisition, and signal conditioning. The system uses statistical process control to predict problems with gas delivery and automatically adjusts the flow and pressure when necessary. Semiconductor Wafer Exchanger Characterization This solution describes an automated functional test system that characterizes a system that transfers semiconductor wafers from a work area to a polishing head and back to the work area. The system tests both 200mm and 300mm wafer exchangers and determines long-term reliability, root cause of failure, and system repeatability. Real-Time Plasma Monitoring in Semiconductor Reactors This solution describes a functional test system that performs 2-D real-time monitoring of the field characteristics inside a plasma chamber. The system records data including the ion flux for later data reduction and analysis. Application Notes and White Papers Application Notes and White Papers In-depth technical papers that explain the techniques to develop test, measurement, and automation systems. Characterization of PLL Clock Generators This application note describes how to make clock jitter measurements, divider check, and lock time measurements on the phase/frequency detector, low-pass filter, voltage controlled oscillator, and base clock divider circuits of a phased lock loop (PLL). Characterization of Mixed Signal ICs This application note covers the hardware and software considerations of characterizing mixed signal ICs used in communication systems. The application note covers device stimuli, device response, timing and synchronization, test sequencing, instrumentation programming, IC programming, data management, and data analysis & presentation. The app note also gives a detailed example using these design techniques on how to characterize an analog to digital converter IC. Purchasing Versus Developing a Test Data Management Solution This white paper describes the benefits of using an off-the-shelf test data management solution versus developing a proprietary system yourself. Characterization of Voice CODECs This application note describes how to characterize voice CODECs including tests for idle channel noise, total distortion, frequency response, input level, gain tracking, and differential offset. Managing Test Data This application note covers the need for managing test data, advantages of using databases in test systems, an introduction to databases, designing a test database, relational databases available today, interfacing to databases, and connecting test software to databases.

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